JPH0241119B2 - - Google Patents

Info

Publication number
JPH0241119B2
JPH0241119B2 JP58080898A JP8089883A JPH0241119B2 JP H0241119 B2 JPH0241119 B2 JP H0241119B2 JP 58080898 A JP58080898 A JP 58080898A JP 8089883 A JP8089883 A JP 8089883A JP H0241119 B2 JPH0241119 B2 JP H0241119B2
Authority
JP
Japan
Prior art keywords
memory
fail
line
relief
lines
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58080898A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59207497A (ja
Inventor
Ikuo Kawaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58080898A priority Critical patent/JPS59207497A/ja
Priority to EP84105285A priority patent/EP0125633B1/en
Priority to DE8484105285T priority patent/DE3482901D1/de
Priority to US06/609,445 priority patent/US4628509A/en
Publication of JPS59207497A publication Critical patent/JPS59207497A/ja
Publication of JPH0241119B2 publication Critical patent/JPH0241119B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/72—Masking faults in memories by using spares or by reconfiguring with optimized replacement algorithms

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Semiconductor Memories (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
JP58080898A 1983-05-11 1983-05-11 メモリ不良ビット救済解析方法 Granted JPS59207497A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP58080898A JPS59207497A (ja) 1983-05-11 1983-05-11 メモリ不良ビット救済解析方法
EP84105285A EP0125633B1 (en) 1983-05-11 1984-05-10 Testing apparatus for redundant memory
DE8484105285T DE3482901D1 (de) 1983-05-11 1984-05-10 Pruefgeraet fuer redundanzspeicher.
US06/609,445 US4628509A (en) 1983-05-11 1984-05-11 Testing apparatus for redundant memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58080898A JPS59207497A (ja) 1983-05-11 1983-05-11 メモリ不良ビット救済解析方法

Publications (2)

Publication Number Publication Date
JPS59207497A JPS59207497A (ja) 1984-11-24
JPH0241119B2 true JPH0241119B2 (en]) 1990-09-14

Family

ID=13731178

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58080898A Granted JPS59207497A (ja) 1983-05-11 1983-05-11 メモリ不良ビット救済解析方法

Country Status (1)

Country Link
JP (1) JPS59207497A (en])

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0424612A3 (en) * 1989-08-30 1992-03-11 International Business Machines Corporation Apparatus and method for real time data error capture and compression for redundancy analysis of a memory
JP2001243795A (ja) 1999-12-24 2001-09-07 Nec Corp 半導体記憶装置
JP5034702B2 (ja) * 2007-06-14 2012-09-26 横河電機株式会社 メモリ試験装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5634198A (en) * 1979-08-27 1981-04-06 Nippon Telegr & Teleph Corp <Ntt> Releaving method of deficient bit of semiconductor memory

Also Published As

Publication number Publication date
JPS59207497A (ja) 1984-11-24

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